Testing Sequence Dependent Defects
New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects
978-3-8383-1219-4
3838312198
116
2010-05-21
49.00 €
eng
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With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
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