Piezoresponse Force Microscopy
Atomic force microscopy, Ferroelectricity, Piezoelectricity
978-620-1-66639-9
6201666397
60
2012-07-08
29.00 €
eng
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Please note that the content of this book primarily consists of articles available from Wikipedia or other free sources online. Piezoresponse force microscopy is a variant of atomic force microscopy that allows imaging and manipulation of ferroelectric domains. This is achieved by bringing a sharp conductive probe into contact with a ferroelectric surface and applying an alternating current bias to the probe tip in order to excite deformation of the sample through the converse piezoelectric effect. The resulting deflection of the probe cantilever is detected through standard split photodiode detector methods and then demodulated by use of a lock-in amplifier. In this way topography and ferroelectric domains can be imaged simultaneously with high resolution.
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