Bookcover of Analysis and Improvement of Virtex-4 Block RAM Built-In Self-Test
Booktitle:

Analysis and Improvement of Virtex-4 Block RAM Built-In Self-Test

Introduction to Virtex-5 Block RAM Built-In Self-Test

LAP LAMBERT Academic Publishing (2010-11-05 )

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ISBN-13:

978-3-8433-6800-1

ISBN-10:
3843368007
EAN:
9783843368001
Book language:
English
Blurb/Shorttext:
A reliable method for testing embedded memories within Virtex-4 and Virtex-5 Field-Programmable Gate Arrays (FPGAs) is needed by the current FPGA community. A method for testing the Virtex-4 embedded Block Random Access Memories (RAMs) using built-In Self-Test(BIST) was initially proposed by Daniel Milton in Built-In Self-Test of Configurable Memory Resources in Field-Programmable Gate-Arrays. However, this method was found to have deficiencies in practical application. Several corrections and improvements are made to this proposed approach, which improves overall BIST generation and execution time. A method for testing the Virtex-5 FPGA Block RAMs is proposed and the suggested configuration settings are described. Four Test Pattern Generators (TPGs) are proposed to implement the BIST, which will consist of 16 configuration bit files.
Publishing house:
LAP LAMBERT Academic Publishing
Website:
https://www.lap-publishing.com/
By (author) :
Brooks Garrison
Number of pages:
120
Published on:
2010-11-05
Stock:
Available
Category:
Electronics, electro-technology, communications technology
Price:
49.00 €
Keywords:
Field-Programmable Gate Array, FPGA, Built-In Self-Test, BiST, Virtex-4, Virtex4, Virtex 4, Virtex-5, Virtex5, Virtex 5, Block RAM

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